PHONON STRUCTURE OF AMORPHOUS SiO x BY INELASTIC TUNNELLING SPECTROSCOPY
نویسنده
چکیده
We present phonon spectra of very thin evaporated amorphous films of SiOx, obtained by inelastic electron tunnelling spectroscopy. The broad features of the results are similar to those found in neutron-scattering, Raman and infra-red measurements on bulk vitreous SiO2 but there are differences of detail. The results show inelastic tunnelling spectroscopy to be a powerful technique for the study of amorphous systems.
منابع مشابه
Phonon structure of amorphous germanium by inelastic electron tunnelling spectroscopy
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